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Mark
W.
Rueh
Partner
1251 Avenue of the Americas
New York, New York
10020-1104
United States
T: (212) 335-4860
F: (917) 778-8860
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Mark W. Rueh is a partner in the Patent Litigation group based in New York.
Mr. Rueh focuses his practice on clients in the medical device, software, and automotive industries and has substantial experience in lawsuits involving sophisticated technical issues.
許可
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New York
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US Patent & Trademark Office
過往經驗
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Clifford Chance US LLP, 2001 - 2008
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Kenyon & Kenyon, 1996 – 2001
教育
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J.D., Syracuse University College of Law 1996
summa cum laude
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B.S., Electrical Engineering, University of Michigan 1993
magna cum laude
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教育
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J.D., Syracuse University College of Law 1996
summa cum laude
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B.S., Electrical Engineering, University of Michigan 1993
magna cum laude
新聞和深入報導
新聞
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